| 扫描近场红外显微镜近场距离控制系统的改进 |
| |
| 引用本文： | 王潜,李永贵.扫描近场红外显微镜近场距离控制系统的改进[J].光学技术,2002,28(6):547-548. |
| |
| 作者姓名： | 王潜 李永贵 |
| |
| 作者单位： | 中国科学院,高能物理研究所,北京,100080 |
| |
| 基金项目： | 国家自然科学基金资助项目 (698710 30 ) |
| |
| 摘 要： | 针尖 样品的距离控制系统是扫描近场红外显微镜的重要组成部分。切变力探测作为一种重要的近场距离控制手段而得到了广泛的应用。介绍了一种对切变力探测系统的改进方法 ,它可以有效地提高石英晶振音叉的品质因数 ,进而提高探测系统对切变力感应的灵敏度。给出了理论分析和实验验证结果
|
| 关 键 词： | 扫描近场光学显微镜 扫描近场红外显微镜 切变力距离控制 石英晶振音叉 |
| 文章编号： | 1002-1582(2002)06-0547-02 |
| 修稿时间： | 2002年2月27日 |
Improvement of scanning near-field infrared microscopy distance control system |
| |
| WANG Qian,LI Yong gui.Improvement of scanning near-field infrared microscopy distance control system[J].Optical Technique,2002,28(6):547-548. |
| |
| Authors: | WANG Qian LI Yong gui |
| |
| Abstract: | Tip sample distance control system is the key part of scanning near field infrared microscopy. Shear force detection as an important method of detection is used widely. A shear force detection system which is redesigned on the base of original model is introduced. It can enhance the quality factor(Q) of quartz tuning fork effectively, so the shear force sensitivity will be improved. It will also help the further research work on scanning near field infrared microscopy. |
| |
| Keywords: | scanning near field optical microscopy scanning near field infrared microscopy shear force distance control quartz tuning fork |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
