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频率特性测试仪
引用本文:施智强,何欣,唐铭杰,沈骋曦.频率特性测试仪[J].国外电子元器件,2008,16(12).
作者姓名:施智强  何欣  唐铭杰  沈骋曦
作者单位:武汉大学,电子信息学院,湖北,武汉,430079
摘    要:以集成的直接数字合成器(DDS)AD9851为核心,利用现场可编程门阵列(FPGA)及外围测量电路,设计并实现了一个频率特性测试仪,可用于测试某一特定网络的频率特性.并给出了幅频和相频特性曲线,并采用软件修正方法提高了整个系统输出的稳定性和可靠性.

关 键 词:幅频特性  相频特性  现场可编程门阵列(FPGA)  单片机

A tester for frequency response characteristic
SHI Zhi-qiang,HE Xin,TANG Ming-jie,SHEN Cheng-xi.A tester for frequency response characteristic[J].International Electronic Elements,2008,16(12).
Authors:SHI Zhi-qiang  HE Xin  TANG Ming-jie  SHEN Cheng-xi
Institution:SHI Zhi-qiang,HE Xin,TANG Ming-jie,SHEN Cheng-xi(School of Electronic Information,Wuhan University,Wuhan 430079,China)
Abstract:Based on the integrated DDS chip AD9851,FPGA and external circuits,a tester for frequency response characteristic is designed and implemented.It is able to measure the frequency response characteristic for a certain network and display the amplitude-frequency and phase-frequency curves.And the output stability and reliability of the whole system is enhanced by software.
Keywords:DDS
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