首页 | 本学科首页   官方微博 | 高级检索  
     


Modeling effects of abrasive particle size and concentration on material removal at molecular scale in chemical mechanical polishing
Authors:Yongguang Wang  Wei An  Zifeng Ni  Jun Wang
Affiliation:School of Mechanical Engineering, Jiangnan University, Wuxi, Jiangsu 214122, PR China
Abstract:A novel material removal model as a function of abrasive particle size and concentration was established in chemical mechanical polishing (CMP) based on molecular scale mechanism, micro-contact mechanics and probability statistics. A close-form equation was firstly developed to calculate the number of effective particles. It found nonlinear dependences of removal rate on the particle size and concentration, being qualitatively agreement with the published experimental data. The nonlinear relation results from the couple relationship among abrasive number, slurry concentration and surface atoms’ binding energy with the particle size. Finally, the system parameters such as the operational conditions and materials properties were incorporated into the model as well.
Keywords:CMP   Abrasive size   Abrasive concentration   Modeling
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号