Auger electron/X-ray photoelectron and cathodoluminescent spectroscopic studies of pulsed laser ablated SrAl2O4:Eu,Dy thin films |
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| Authors: | P.D. Nsimama O.M. Ntwaeaborwa |
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| Affiliation: | a Physics Department, University of the Free State, P.O. Box 339, Bloemfontein, ZA 9300, South Africa
b Department of Laboratory Technology, Dar Es Salaam Institute of Technology, P.O. Box 2958, Dar Es Salaam, Tanzania |
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| Abstract: | Auger electron/X-ray photoelectron and cathodoluminescent (CL) spectroscopic studies were conducted on pulsed laser deposited SrAl2O4:Eu2+,Dy3+ thin films and the correlation between the surface chemical reactions and the decrease in the CL intensity was determined. The Auger electron and the CL data were collected simultaneously in a vacuum chamber either maintained at base pressure or backfilled with oxygen gas. The data were collected when the films were irradiated for 14 h with 2 keV electrons. The CL emission peak attributed to the 4f65d1 → 4f7 transitions was observed at ∼521 nm and the CL intensity of the peaks degraded at different rates in different vacuum conditions. X-ray photoelectron spectroscopy (XPS) data collected from degraded films suggest that strontium oxide (SrO) and aliminium oxide (Al2O3) were formed on the surface of the film as a result of electron stimulated surface chemical reaction (ESSCR). |
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| Keywords: | SrAl2O4:Eu2+,Dy3+ CL Electron degradation ESSCR |
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