Resistivity changes in cold-worked Cd-Ag and Cd-Zn

Polycrystalline wires of Cd-0.3 at. %Ag, Cd-1.0 at. % Ag, Cd-3.3 at. % Ag and Cd-0.1 at. % Zn, Cd-0.5 at. % Zn, Cd-2.6 at. % Zn were deformed by torsion in liquid nitrogen. Up to 200 K their isochronous annealing spectrum of electrical resistivity reveals the same main features (i.e. annealing stages C1, C2 and C3) as that of pure Cd and of dilute alloys Cd-Mg and Cd-Sn. The position of the annealing stages is insensitive to the type and amount of impurity and the degree of deformation. The gradual diminution of stage C3 with increasing Ag content is ascribed either to a dislocation mechanism or a disappearance of point defects by short range migration.We wish to express our thanks to Dr. P.Luká and Dr. I.Stulíková (Charles University, Prague) for stimulating discussions and valuable comments.