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A method to assess the combined effects of neutrons and low temperature on transistor circuits
Authors:M. Bumbaugh  S. Rattner
Affiliation:U. S. Army Electronics Research and Development Command, Harry Diamond Laboratories , Adelphi, 20783, Maryland
Abstract:Methodolgy is presented which permits the conservative performance assessment of transistor electronics under the combined environments of neutron irradiation and low temperature.
Keywords:
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