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A method to assess the combined effects of neutrons and low temperature on transistor circuits |
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| Authors: | M. Bumbaugh S. Rattner |
| Affiliation: | U. S. Army Electronics Research and Development Command, Harry Diamond Laboratories , Adelphi, 20783, Maryland |
| Abstract: | Methodolgy is presented which permits the conservative performance assessment of transistor electronics under the combined environments of neutron irradiation and low temperature. |
| Keywords: | |