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Polarized XANES spectroscopy: The K edge of layered K-rich silicates
Affiliation:1. J. Heyrovský Institute of Physical Chemistry, Academy of Sciences of the Czech Republic, Dolejškova 3, CZ18223 Prague 8, Czech Republic;2. Sokolovská uhelná, právní nástupce, a.s., Staré náměstí 69, CZ35601 Sokolov, Czech Republic;3. Safety & Hlth. Expert Inst., Ostrovského 253, CZ15000 Prague 5, Czech Republic;4. Charles University Prague, Faculty of Science, Department of Physical and Macromolecular Chemistry, Albertov 2030, CZ12840 Prague 2, Czech Republic
Abstract:Angle-resolved XANES spectra have been collected at the potassium K edge using polarized synchrotron radiation on several natural mica crystals. Experimental data have been interpreted on the basis of the MS theory and, within this theoretical framework, the edge of this low-Z atom is decomposed so as to produce two partial patterns giving, respectively, the full in-plane absorption spectrum and the full out-of-plane one. The method here described is appropriate to describe the X-ray dichroic behaviour of solid layered compounds and/or two-dimensionally extended structures.
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