Current image formation in combined STM/AFM of metal nanoclusters in dielectric films |
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| Authors: | M. A. Lapshina D. O. Filatov D. A. Antonov |
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| Affiliation: | (1) Lobachevsky State University of Nizhni Novgorod, pr. Gagarina 23, Nizhni Novgorod, 603950, Russia |
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| Abstract: | Current imaging in studying metal nanoclusters in thin dielectric films by combined scanning tunneling and atomic-force microscopy was simulated. It was shown that sizes of increased conductivity regions in current images, caused by electron tunneling through nanoclusters, are controlled by the size of the probe-film surface contact area. |
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