Accuracy characteristics for quantum process tomography using superconductor phase qubits |
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| Authors: | Yu. I. Bogdanov S. A. Nuyanzin |
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| Affiliation: | 1.Institute of Physics and Technology,Russian Academy of Sciences,Moscow,Russia;2.Institute of Electronic Technology (Technical University),Zelenograd, Moscow,Russia |
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| Abstract: | A method for the precision statistical control of quantum processes is developed on the basis of applications of superconductor phase qubits. A detailed analysis of tomographic accuracy for a 2-qubit SQiSW gate arising due to capacitive coupling between qubits is performed by means of universal quantum tomography. The presented approach can be used to solve problems of quality and efficiency in superconductor quantum information technologies. |
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