| 两基准试样法及其在激光显微光谱分析中的应用 |
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| 引用本文： | 李兆智. 两基准试样法及其在激光显微光谱分析中的应用[J]. 分析测试学报, 1988, 0(1) |
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| 作者姓名： | 李兆智 |
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| 作者单位： | 中国船舶工业总公司十二研究所 |
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| 摘 要： | 本文提出了采用两基准试样法进行激光显微光谱定量分析的座标系统和计算公式,并对其可行性和适用性进行了初步探讨。
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Double-Aligning Specimen Method and its Application in Laser Emission Microspectrum Analysis |
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| Li ZhaoZhi The th Research Insituet,State Shipbuilding Corporation of China. Double-Aligning Specimen Method and its Application in Laser Emission Microspectrum Analysis[J]. Journal of Instrumental Analysis, 1988, 0(1) |
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| Authors: | Li ZhaoZhi The th Research Insituet State Shipbuilding Corporation of China |
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| Affiliation: | Li ZhaoZhi The 12th Research Insituet,State Shipbuilding Corporation of China |
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| Abstract: | By using double-aligning specimen method, a coordinate system and calculating formula havebeen established for laser emission microspectrum quantitative analysis. A preliminary study ontheir feasibility and suitability has been conducted. |
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| Keywords: | Laser Emission Microsooectrum Analysis Double-Aligaing Specimens Samples |
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