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X-ray double crystal topographic measurements of distorted crystals |
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| Authors: | E. M. Trukhanov I. S. Vassilev P. A. Botev N. V. Lyakh Yu. G. Sidorov S. I. Stenin |
| Abstract: | A procedure to measure local variations in lattice distortions based on the shrink and enlarge effect of contours, observed on topographs taken by X-ray double crystal reflection technique has been proposed and applied in the study of CdTe crystals. A domination of the orientational component of distortions has been established, reaching to hundreds of arcsec for points at a distance of 1 cm. The variation in spacings Δd/d does not exceed hundredths of a per cent. |
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