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Numerical Method to Fit the Refractive Index Profile of Planar Microlenses Made by Ion Exchange Techniques |
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| Authors: | Eva Acosta Susana Ríos Masahiro Oikawa Akimitsu Sato Kenichi Iga |
| Institution: | (1) Laboratorio de Óptica, Departmento de Física Aplicada, Facultad de Fisica Universidad de Santiago de Compostela, E-15706 Santiago de Compostela, Galicia, Spain;(2) Nippon Sheet Glass Co., Ltd., Sumimoto Fudosan Shiba Bldg., 11-11, 1-Chome, Shiba, Minato-ku, Tokyo 105, Japan;(3) Nippon Sheet Glass Co., Ltd., Fiber Optics Division, Tsukuba Research Center, 5-4, Tokodai Tsukuba-rity, Ibaraki 300-26, Japan;(4) Tokyo Institute of Technology, 4259, Nagatsuta, Midori-ku, Yokohama 227, Japan |
| Abstract: | We present a fitting method for obtaining a functional form of the refractive index profile of planar microlenses made by ion exchange techniques from total shearing interferometric measurements. Compared to the usual power series expansion fit, this method allows a reduction in the number of coefficients needed to characterize a lens. |
| Keywords: | planar microlenses 3-D distributed index profile shearing interferometry ion exchange techniques |
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