Effect of Ti4+ ions on the magnetic and dielectric properties of Mg-ferrite

X-ray diffraction, the real part (ε′), the imaginary part (ε″) of dielectric constant, and the molar magnetic susceptibility (χ_M) for Mg_1+xTi_xFe_2−2xO₄ ferrite (0.1⩽x⩽0.9) were studied. The date of X-ray diffraction showed that the unit cell parameter increases with Ti concentration and ascribed to the predicted variation of the cation distribution, while Mg²⁺ ions are highly diffusible and very sensitive to heat. The effect of dilution by Ti ions is discussed in terms of increasing superparamagnetic and single domain (SP/SD) grains. The measurements of ε′ were performed at different temperatures as a function of frequency, while the magnetic susceptibility was studied at different magnetic field intensities. The variation of the dielectric properties depends mainly on the valence exchange between the different metal ions in the same site or in different sites. All parameters such as ε′, ε″, χ_M showed a decrease in value with increasing Ti and Mg concentration. The dispersion in ε′ with frequency disappeared gradually with increasing Ti concentration.