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X-ray diffraction study of cerium-and thulium-doped (Sr,Ba)Nb2 O6 single crystals |
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| Authors: | T. S. Chernaya T. R. Volk B. A. Maksimov M. K. Blomberg L. I. Ivleva I. A. Verin V. I. Simonov |
| Affiliation: | (1) Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 119991, Russia;(2) Department of Physics, University of Helsinki, Siltavuorenpenger 20 I, P.O. Box 9, Helsinki, FIN-00014, Finland;(3) Institute of General Physics, Russian Academy of Sciences, ul. Vavilova 38, Moscow, 117942, Russia |
| Abstract: | The structural models of cerium-and thulium-doped (Sr0.61Ba0.39)Nb2O6 solid solutions were established and refined on the basis of single-crystal X-ray diffraction data. The dopants were located, and their concentrations in the specimens were refined. The effect of the Sr/Ba ratio and doping with rare earth elements on the structural characteristics of (SrxBa1-x )Nb2O6 crystals was analyzed. |
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