Scanning near-field optical microscopy |
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Authors: | H Heinzelmann D W Pohl |
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Institution: | (1) Institut für Physik, Universität Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland;(2) IBM Research Laboratory, Säumerstrasse 4, CH-8803 Rüschlikon, Switzerland |
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Abstract: | Scanning Near-field Optical Microscopy (SNOM) allows the investigation of optical properties on subwavelength scales. During the past few years, more and more attention has been given to this technique that shows enormous potential for imaging, sensing and modification at near-molecular resolution. This article describes the technique and reviews recent progress in the field. |
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Keywords: | 61 16 Ch |
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