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Structural, Morphology and Optical Properties of Epitaxial ZnO Films Grown on Al2O3 by MOCVD
作者姓名:周生强  吴名枋  姚淑德  王立  江风益
作者单位:[1]School of Physics, Peking University, Beijing 100871 [2]Engineering Research Center for Luminescent Materials and Devices (Ministry of Education), Nanchang University, Nanchang 330047
基金项目:Supported by the National Natural Science Foundation of China under Grant No 10375004, and the Key Laboratory of Heavy Ion Physics, Ministry of Education of China.
摘    要:Epitaxial ZnO films are grown on Al2O3 (0001) by the MOCVD method. These films are high quality wurtzite crystals with (0001) orientation. Big hexagonal crystallites (diameter from several decades to 100 μm) are found on the surface. Inside these crystallites, a stronger luminescence is observed compared with the plain area. Transmission electronic microscopy reveals that the film is thicker inside the hexagonal crystallites than the plain area, and some crystallites are not connected with each other and are slightly rotated with respect to their neighbours.

关 键 词:形态学  光学特性  外延氧化锌薄膜  纤维锌矿晶体
收稿时间:2005-11-22
修稿时间:2005-11-22

Structural, Morphology and Optical Properties of Epitaxial ZnO Films Grown on Al2O3 by MOCVD
ZHOU Sheng-Qiang, WU Ming-Fang, YAO Shu-De, WANG LI, JIANG Feng-Yi.Structural, Morphology and Optical Properties of Epitaxial ZnO Films Grown on Al2O3 by MOCVD[J].Chinese Physics Letters,2006,23(4):1023-1025.
Authors:ZHOU Sheng-Qiang  WU Ming-Fang  YAO Shu-De  WANG LI  JIANG Feng-Yi
Abstract:
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