Trace and surface analysis of ceramic layers of solid oxide fuel cells by mass spectrometry |
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Authors: | J S Becker U Breuer J Westheide A I Saprykin H Holzbrecher H Nickel H-J Dietze |
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Institution: | Zentralabteilung für Chemische Analysen, Forschungszentrum Jülich GmbH, D-52425, Jülich, Germany. |
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Abstract: | For the trace analysis of impurities in thick ceramic layers of a solid oxide fuel cell (SOFC) sensitive solid-state mass spectrometric methods, such as laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) and radiofrequency glow discharge mass spectrometry (rf-GDMS) have been developed and used. In order to quantify the analytical results of LA-ICP-MS, the relative sensitivity coefficients of elements in a La(0.6)Sr(0.35)MnO(3) matrix have been determined using synthetic standards. Secondary ion mass spectrometry (SIMS) - as a surface analytical method - has been used to characterize the element distribution and diffusion profiles of matrix elements on the interface of a perovskite/Y-stabilized ZrO(2) layer. The application of different mass spectrometric methods for process control in the preparation of ceramic layers for the SOFC is described. |
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