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Studies of the alignment properties of antiferroelectric liquid crystals by X-ray diffraction
Authors:L. A. Parry-Jones   S. M. Beldon  D. Rodriguez-Martin  R. M. Richardson  S. J. Elston
Abstract:It is observed optically that in a parallel rubbed antiferroelectric liquid crystal device, the texture consists of domains with two distinct optic axes, which make equal and opposite angles with the rubbing direction. It is proposed that this is caused by a large electroclinic effect at the surfaces during layer formation in the SmA* phase. This hypothesis is verified by finding the layer structure in single, parallel and skew rubbed devices by using X-ray diffraction.
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