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电感耦合等离子体质谱法测定高钝镉中的杂质元素
引用本文:曹淑琴 陈杭亭. 电感耦合等离子体质谱法测定高钝镉中的杂质元素[J]. 光谱学与光谱分析, 1999, 19(6): 854-857
作者姓名:曹淑琴 陈杭亭
作者单位:中国科学院长春应用化学研究所
摘    要:采用电感耦合等离子体质谱光测定离纯镉中的杂质元素。讨论了镉基体的谱线干扰,比较了镉基体产生的多原子离子的干扰程度,该干扰按CdH、CdO、CdO2、CdAr、CdOH和CdOH2顺序递减。研究了不同浓度镉基体对分析物信号的抑制或增强效应,镉的浓度大于0.25g·L^-1时,对质量数小于100的分析物的信号强度产生抑制,而以质量数大于150的分析的信号强度产生增强,采用^89Y和^209Bi作内标分

关 键 词:ICP-MS 等离子体质谱 高纯镉 杂质元素 镉 测定

Determination of the impurities elements in high-purity cadmium by inductively coupled plasma mass spectrometry]
S Cao,H Chen,X Zeng. Determination of the impurities elements in high-purity cadmium by inductively coupled plasma mass spectrometry][J]. Spectroscopy and Spectral Analysis, 1999, 19(6): 854-857
Authors:S Cao  H Chen  X Zeng
Affiliation:Changchun Institute of Applied Chemistry, The Chinese Academy of Sciences, National Electrochemistry & Spectroscopy Research and Analysis Center, 130022 Changchun.
Abstract:A method for the determination of impurity elements in high purity cadmium by inductively coupled plasma mass spectrometry was developed. The spectral interference arising from Cd was discussed and the magnitude of interference by the polyatomic ion of Cd was compared. The effect of the high concentration Cd on the analyte signal was studied. The results showed that Cd possessed both significant suppression effects on the light mass elements signal and enhancement effects on the heavy mass elements signal, and the effects can be corrected by the use of internal standard elements. In this paper, Y and Bi was employed for the light mass elements and the heavy mass elements, respectively. As, Be, Co, Cu, Ga, Ge, Mn, Mo, Pb, Ni, Sr, Au, Tl, Th, V and U in high purity cadmium were determined. Detection limits are 0.005-0.052 microg x L(-), and the recoveries of standard addition are 82%-108%.
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