Electronic surface structure of <Emphasis Type="Italic">n</Emphasis>-ML Ag/Cu(111) and Cs/<Emphasis Type="Italic">n</Emphasis>-ML Ag/Cu(111) as investigated by 2PPE and STS期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

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Electronic surface structure of <Emphasis Type="Italic">n</Emphasis>-ML Ag/Cu(111) and Cs/<Emphasis Type="Italic">n</Emphasis>-ML Ag/Cu(111) as investigated by 2PPE and STS

Authors:	M?Wessendorf C?Wiemann Email author" target="_blank">M?Bauer Email author M?Aeschlimann MA?Schneider H?Brune K?Kern

Institution:	(1) Department of Physics, Technical University of Kaiserslautern, 67663 Kaiserslautern, Germany;(2) Max-Planck-Institute for Solid State Research, 70569 Stuttgart, Germany;(3) IPN, Ecole Polytechnique Federale de Lausanne, 1015 Lausanne, Switzerland

Abstract:	We investigated the electronic structure of epitaxially grown silver films on Cu(111) with and without adsorption of cesium by means of scanning tunneling spectroscopy and two-photon photoemission. This system has been chosen as a model system to engineer and measure the dynamics of charge-transfer processes between an adsorbate and a heterogeneous substrate. Special emphasis has been laid on the investigation of the energy shift of the Shockley-type surface state and an excited cesium resonance as a function of Ag film thickness. For the cesium resonance we observe an increase in line width with increasing layer thickness. PACS 68.37.Ef; 68.43.-h; 68.55.Jk; 73.20.-r

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