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Plasma emission spectroscopy of solids irradiated by intense XUV pulses from a free electron laser
Authors:TWJ Dzelzainis  J Chalupsky  M Fajardo  R Fäustlin  PA Heimann  V Hajkova  L Juha  M Jurek  FY Khattak  M Kozlova  J Krzywinski  RW Lee  B Nagler  AJ Nelson  FB Rosmej  R Soberierski  S Toleikis  T Tschentscher  SM Vinko  JS Wark  D Riley
Institution:1. School of Mathematics and Physics, Queen''s University, Belfast, Belfast BT7 1NN, UK;2. Institute of Physics, AS CR, Prague 8, Czech Republic;3. Centro de Fisica dos Plasmas, Instituto Superior Técnico, Lisboa, Portugal;4. Deutsches Elektron-Synchrotron DESY, Notkestrasse 85, 22607 Hamburg, Germany;5. Lawrence Livermore National Laboratory, University of California, P.O. Box 808, Livermore, CA 94551, USA;6. Department of Physics, Kohat University of Science and Technology, Kohat-26000, NWFP, Pakistan;7. Inst. of Physics, Polish Academy of Sciences, Poland;8. SLAC National Accelerator Laboratory 2575 Sand Hill Road, Menlo Park, CA 94025 USA;9. Clarendon Laboratory, University of Oxford, South Parks Road OX1 3PU, UK;10. Universite Pierre et Marie Curie, UMR 7605 case 128, 4 Place Jussieu, 75252 Paris Cedex 05, France;11. Lawrence Berkeley National Laboratory, 1 Cyclotron Road Berkeley, CA 94720 USA
Abstract:The FLASH XUV-free electron laser has been used to irradiate solid samples at intensities of the order 1016 W cm?2 at a wavelength of 13.5 nm. The subsequent time integrated XUV emission was observed with a grating spectrometer. The electron temperature inferred from plasma line ratios was in the range 5–8 eV with electron density in the range 1021–1022 cm?3. These results are consistent with the saturation of absorption through bleaching of the L-edge by intense photo-absorption reported in an earlier publication.
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