Crystal structure and magnetic properties of nanosized Mg(Fe0.8Ga0.2)2O4-δ films on Si substrates |
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Authors: | A V Trukhanov A I Stognij S V Trukhanov A A Geraskin V A Ketsko |
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Institution: | 17782. Scientific-Practical Materials Research Centre, National Academy of Sciences of Belarus, ul. P. Brovki 19, Minsk, 220072, Belarus 27782. Moscow State Institute of Radio Engineering, Electronics, and Automation (Technical University), pr. Vernadskogo 78, Moscow, 119454, Russia 37782. Kurnakov Institute of General and Inorganic Chemistry, Russian Academy of Sciences, Leninskii pr. 31, Moscow, 119991, Russia
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Abstract: | Film samples of nominal Mg(Fe0.8Ga0.2)2O4-δ composition were obtained on Si(100) substrates by oxygen-ion-beam sputtering of a Mg(Fe0.8Ga0.2)2O4-δ ceramic target. The film thicknesses were ~200 and ~400 nm. Field dependences of the specific magnetization of ~200-nm films annealed at different temperatures (800–1000°C) have been measured. The crystal structure, surface morphology, and magnetic characteristics of films of different thicknesses (~200 and ~400 nm) are investigated. The reasons for the discrepancy between the specific magnetizations of the films obtained and their ceramic analog are discussed. |
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