Using the dissipation mode in high resolution atomic force microscopy |
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| Authors: | A G Temiryazev A V Kraev S A Saunin |
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| Institution: | 1. Kotel’nikov Institute of Radio Engineering and Electronics (Fryazino Branch), Russian Academy of Sciences, Fryazino, Moscow oblast, 141190, Russia
2. OOO AIST-NT, Zelenograd, Moscow, 124460, Russia
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| Abstract: | The possibility of using the dissipation mode in high-resolution atomic force microscopy is demonstrated. By the dissipation mode we mean the dynamic mode in which the cantilever oscillates at a resonance frequency and the oscillation amplitude serves as a signal of the feedback tracing a distance to the surface. The possibility of obtaining molecular resolution when scanning in air is shown. The procedure of choosing the optimum scanning parameters is considered. |
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