Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction |
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| Authors: | Jesse R Williams Masaaki Kobata Igor Pis Eiji Ikenaga Takeharu Sugiyama Keisuke Kobayashi Naoki Ohashi |
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| Institution: | 1. International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan;2. NIMS Saint-Gobain Research Center of Excellence for Advanced Materials, NIMS, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan;3. Beamline Station, National Institute for Materials Science (NIMS), SPring-8, 1-1-1, Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan;4. Department of Surface and Plasma Science, Faculty of Mathematics and Physics, Charles University, V Hole?ovi?kách 2, 18000 Prague 8, Czech Republic;5. Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1, Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan |
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| Abstract: | The surface structure of a single-crystal ZnO wafer was studied by angle-resolved x-ray photoelectron spectroscopy (ARXPS) using synchrotron radiation. As a result, well-defined x-ray photoelectron diffraction (XPD) patterns were obtained for the (0001) and (000) polar surfaces using the photoemission from the Zn 2p3/2 and O 1s core levels. The XPD patterns were indexed assuming forward scattering of photoelectrons by neighboring ions. Further, the XPD patterns for the (0001) and (000) surfaces were different from each other, indicating the possibility for using the XPD technique for polarity determination. |
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