Resonant coherent excitation of 94 MeV/u Ar17+ ions in the $$(2bar 20)$$ planar channel of a silicon crystal

The charge exchange and characteristic x-radiation of channeled ions under resonant coherent excitation are simultaneously described in terms of the density matrix formalism. The survival fraction of 94 MeV/u Ar¹⁷⁺ ions in the ((2bar 20)) planar channel of a silicon crystal is calculated, and the angular distribution of x-ray emission of these ions is analyzed.