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| 取向硅钢片晶粒尺寸快速检测方法 | |
| 引用本文： | 张绍强,刘勇生,陈冷.取向硅钢片晶粒尺寸快速检测方法[J].东莞理工学院学报,2007,14(3):29-32. |
| 作者姓名： | 张绍强 刘勇生 陈冷 |
| 作者单位： | 1. 东莞理工学院,电子工程系,广东东莞,523808 2. 东莞理工学院,网络中心,广东东莞,523808 3. 北京科技大学,材料学系,北京,100083 |
| 摘 要： | 提出了一种基于X射线面探测器衍射系统的晶粒尺寸快速检测方法,根据晶粒取向不同其衍射花样也不同的原理,检测了取向硅钢片晶粒尺寸.实验结果表明,这种方法操作简单,能够准确测量在一定尺寸范围内的板材的晶粒尺寸,并与背散射电子衍射结果进行了比较,探索了用X射线面探测器衍射系统在工业上进行金属板材晶粒尺寸在线检测的可行性.该方法有希望发展成为工业生产中金属板材的晶粒尺寸在线检测技术. |
| 关 键 词： | 晶粒尺寸 X射线面探测器 在线检测 取向硅钢片 |
| 文章编号： | 1009-0312（2007）03-0029-04 |
| 收稿时间： | 2006-07-04 |
| 修稿时间： | 2006-07-04 |
The Fast Grain Size Measurement of Grain-oriented Si Steel Sheet by Using X-ray Area Detector |
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| ZHANG Shao-qiang,LIU Yong-sheng,CHEN Leng.The Fast Grain Size Measurement of Grain-oriented Si Steel Sheet by Using X-ray Area Detector[J].Journal of Dongguan Institute of Technology,2007,14(3):29-32. | |
| Authors: | ZHANG Shao-qiang LIU Yong-sheng CHEN Leng |
| Institution: | 1. Department of Electronic Engineering, Dongguan University of Technology, Dongguan 523808, China; 2. Network Center, Dongguan University of Technology, Dongguan 523808, China; 3. Department of Materials, University of Science and Technology Beijing, Beijing 100083, China |
| Abstract: | The grain size of grain-oriented Si steel sheet was measured by the x-ray area detector for comparision with the result of the Electron Back-Scatter Diffraction. And the possibility of using this method to measure the grain size on line was discussed. The results indicate that this method could be developed for the online grain size measurement technology of the metal sheet for its outstanding performance. |
| Keywords: | EBSD |
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