| Abstract: | The patterns of change in the structure and phase composition of tin-fullerite films subjected to thermal annealing in vacuum at different temperatures (430, 450, 470, and 490 K) are studied using scanning electron microscopy, atomic-force microscopy, X-ray diffraction, and X-ray spectrum microanalysis. It is established that annealing at T = 450 K or higher leads to significant changes in the structures and phases of films; namely, new phases Sn x C60 are formed in the form of threadlike crystals with lengths of 6 μm containing 98 at % C and 2 at % Sn and ball-shaped isolations with diameters up to 12 μm consisting of 50 at % C and 50 at % Sn. |
