Ultrafast dynamic ellipsometry measurements of early time laser ablation of titanium thin films |
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Authors: | C A Bolme D J Funk |
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Institution: | (1) Department of Chemistry, Massachusetts Institute of Technology, Cambridge, MA 02139, USA;(2) Los Alamos National Laboratory, Los Alamos, NM 87545, USA |
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Abstract: | The dynamics of laser ablated titanium thin films are investigated using a recently developed technique that measures time-resolved
and one-dimensional spatially-resolved ablation dynamics in a single shot. Ultrafast dynamic ellipsometry, a technique based
on space-shifted spectral interferometry, uses the time-dependent frequency of a chirped laser pulse to provide time encoding,
allowing the picosecond probing of material dynamics in a single shot. With this technique, the sample is probed at two different
incident angles with both s- and p-polarized light, which measures the motion of the material and any change in its complex
refractive index. Ultrafast dynamic ellipsometry is applied to study the mechanism of initiation by laser-based optical detonators
that employ the ablation of titanium thin films. The resulting data indicate that the titanium is ablated as a fragmented
flyer and not as an expanding plasma. |
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Keywords: | PACS" target="_blank">PACS 07 60 Fs 79 20 Ds |
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