Study of layered and defective amorphous solids by means of thermal wave method |
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Authors: | E.S Nogueira |
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Affiliation: | Department of Ceramic Engineering and Graduate Center for Materials Research, University of Missouri-Rolla, Rolla, MO 65409-1170, USA |
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Abstract: | In this work the thermal properties and the thickness calibration in layered thick acrylic films using the thermal wave method are reported. The results from acrylic films on two different substrates showed that thermal diffusivity and conductivity can be measured for both supports, metallic and glassy. The experimental applicability of a 1-D model and accuracy of the thickness measurement are also discussed. |
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Keywords: | T150 P290 |
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