Ion extraction from the surface ablated materials in electric fields using an intense femtosecond laser pulse |
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Authors: | T Kato M Kurata-Nishimura T Kobayashi Y Okamura-Oho T Sano Y Hayashizaki Y Matsuo J Kawai |
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Institution: | (1) RIKEN Genomic Science Center, Tsurumi, Yokohama, Kanagawa 230-0045, Japan;(2) Discovery Research Institute, RIKEN, Wako, Saitama 351-0198, Japan;(3) RIKEN Nishina Center for Accelerator-Based Science, Wako, Saitama 351-0198, Japan |
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Abstract: | In order to develop a femtosecond laser ablation (fsLA) ion source for TOF mass spectrometry, we have analyzed time-resolved
images of laser-induced fluorescence from Sm+ ions produced by fsLA of a solid samarium in electric fields. The polarity and the strength of electric fields had a remarkable
effect on the expansion of Sm+ ions. Moreover, accelerating electric fields elongated the duration of the ion emission from the samarium surface in fsLA,
which degraded time-focusing of the ions. We have found that suppression the continuous ion emission caused by fsLA in electric
fields is most important in TOF measurements. |
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Keywords: | PACS" target="_blank">PACS 52 38 Mf 82 80 Ms 34 50 Dy |
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