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Ion extraction from the surface ablated materials in electric fields using an intense femtosecond laser pulse
Authors:T Kato  M Kurata-Nishimura  T Kobayashi  Y Okamura-Oho  T Sano  Y Hayashizaki  Y Matsuo  J Kawai
Institution:(1) RIKEN Genomic Science Center, Tsurumi, Yokohama, Kanagawa 230-0045, Japan;(2) Discovery Research Institute, RIKEN, Wako, Saitama 351-0198, Japan;(3) RIKEN Nishina Center for Accelerator-Based Science, Wako, Saitama 351-0198, Japan
Abstract:In order to develop a femtosecond laser ablation (fsLA) ion source for TOF mass spectrometry, we have analyzed time-resolved images of laser-induced fluorescence from Sm+ ions produced by fsLA of a solid samarium in electric fields. The polarity and the strength of electric fields had a remarkable effect on the expansion of Sm+ ions. Moreover, accelerating electric fields elongated the duration of the ion emission from the samarium surface in fsLA, which degraded time-focusing of the ions. We have found that suppression the continuous ion emission caused by fsLA in electric fields is most important in TOF measurements.
Keywords:PACS" target="_blank">PACS  52  38  Mf  82  80  Ms  34  50  Dy
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