| Abstract: | Several processes have to be automated in order to use graphene in future industrial applications. One of these is the detection and characterization of graphene and few‐layer graphite (FLG) flakes on a substrate. Raman spectroscopy is an ideal tool for this purpose, as it allows not only the identification of these graphitic materials on arbitrary substrates but also monitoring the quality of flakes within the sample. In this paper, we report how graphene and FLG crystallites can be automatically detected and characterized by monitoring the evolution of Raman bands. We present an algorithm that achieves this purpose and thus has special potential in industrial applications of graphene. Copyright © 2010 John Wiley & Sons, Ltd. |
