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A simple method to determine the step heights on ultrathin heteroepitaxial films |
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| Institution: | 1. Huygens-Kamerlingh Onnes Laboratory, Leiden Institute of Physics, Leiden University, Niels Bohrweg 2, Leiden, The Netherlands;2. IBM T.J. Watson Research Center, 1101 Kitchawan Road, Yorktown Heights, New York 10598, USA;1. Department of Physics, Simon Fraser University, 8888 University Drive, Burnaby, British Columbia V5A 1S6, Canada;2. Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, Jülich 52425, Germany;3. Jülich Aachen Research Alliance (JARA), Fundamentals of Future Information Technology, Jülich 52425, Germany;4. Experimentalphysik IV A, RWTH Aachen University, Aachen, Germany |
| Abstract: | The step heights or first interlayer spacings on ultrathin heteroepitaxial films of Fe on Au(001) have been determined from the energy-dependent angular profiles of the specular diffraction beam obtained from low energy electron diffraction (LEED). This method requires little effort in calculation and can be used as a guide in the widely used dynamical LEED calculation of the energy-dependent peak intensity. It is also very general and can be applied to other ultrathin heteroepitaxial films as long as the scattering factors of constituent atoms have slow varying phases relative to the phase change due to step height in the low energy regime. |
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