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A study of Raman spectroscopy and low-temperature specific heat in gel-synthesized amorphous silica
Authors:A Bartolotta  G Carini  G D'Angelo  M Ferrari  A Fontana  M Montagna  F Rossi and G Tripodo
Institution:

a Istituto di Tecniche Spettroscopiche del C. N. R., Via La Farina, 98122 Messina, Italy

b Dipartimento di Fisica and INFM, Università di Messina, Contrada Papardo, Salita Sperone 31, 98166 S. Agata, Messina, Italy

c Consiglio Nazionale delle Ricerche, Centro di Fisica degli Stati Aggregati, 38050 Povo (Trento), Italy

d Dipartimento di Fisica and INFM, Università di Trento, 38050 Povo (Trento), Italy

Abstract:A comparative study of low-temperature specific heat (1.5–25 K), Cp, and low-frequency Raman scattering (<150 cm−1) has been performed in amorphous silica samples synthesized by sol–gel method (xerogels) and thermally densified in a range of densities, from ρ=1250 kgm−3 to ρ=2100 kgm−3, close to the density of the melt quenched vitreous silica (v-SiO2). The present analysis concerns the application of the low-energy vibrational dynamics as an appropriate tool for monitoring the progressive thermal densification of silica gels. By comparison with v-SiO2, the Raman and thermal properties of xerogels with increasing thermal treatment temperature revealed the following important results: (i) the existence of a critical treatment temperature at about 870°C, where a homogeneous viscous sintering produces full densification of the samples. This effect is detected by the observations of the Boson peak in Raman spectra at about 45 cm−1 and of a peak in Cp(T)/T3, very close to those observed in v-SiO2; (ii) in silica xerogels treated at temperatures less than about 800°C, the low-frequency Raman scattering is greater, with a continuous decreasing unstructured shape, and the Boson peak is not detected in the spectra.
Keywords:
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