Kronig-Penney-type calculations for electron tunneling through thin disordered dielectric films |
| |
Authors: | E. StollT. Schneider |
| |
Affiliation: | IBM Zurich Research Laboratory, 8803 Rüschlikon, Switzerland |
| |
Abstract: | Kronig-Penney-type calculations were used to evaluate the tunneling probability through a thin disordered dielectric film between two metallic electrodes. Our calculations indicate that the tunneling probability increases with increasing disorder. |
| |
Keywords: | |
本文献已被 ScienceDirect 等数据库收录! |