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High-speed photorefraction at telecommunication wavelength 1.55 microm in Sn2P2S6:Te
Authors:Mosimann Roger  Marty Patrick  Bach Tobias  Juvalta Flurin  Jazbinsek Mojca  Günter Peter  Grabar Alexander A
Institution:Nonlinear Optics Laboratory, Swiss Federal Institute of Technology, ETH Zurich 8093 Zurich, Switzerland. nlo@phys.ethz.ch
Abstract:We demonstrated for what is the first time to our knowledge photorefractive two-wave mixing in a bulk ferroelectric crystal using cw light at the telecommunication wavelength 1.55 microm. In the Te-doped ferroelectric semiconductor Sn2P2S6 with absorption constant <0.1 cm(-1) at 1.55 microm, grating recording times of 10 ms and a two-beam coupling gain of 2.8 cm(-1) have been measured at 350 mW power (intensity 440 W/cm(2)) without a necessity to apply an external electric field. With a moving grating technique, a maximal gain of 6.0 cm(-1) has been obtained.
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