Analytical bounds for the electromechanical buckling of a compressed nanocantilever

An analytical approach is presented for the accurate definition of lower and upper bounds for the pull-in voltage and tip displacement of a micro- or nanocantilever beam subject to compressive axial load, electrostatic actuation and intermolecular surface forces. The problem is formulated as a nonlinear two-point boundary value problem and has been transformed into an equivalent nonlinear integral equation. Initially, new analytical estimates are found for the beam deflection, which are then employed for assessing novel and accurate bounds from both sides for the pull-in parameters, taking into account for the effects of the compressive axial load. The analytical predictions are found to closely agree with the numerical results provided by the shooting method. The effects of surface elasticity and residual stresses, which are of significant importance when the physical dimensions of structures descend to nanosize, are also included in the proposed approach.