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Inside Cover: Reliability of Orientational Order Parameters Determined from Two‐dimensional X‐ray Diffraction Patterns: A Simulation Study (ChemPhysChem 11/2016) |
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| Authors: | Frank Jenz Dr. Stefan Jagiella Prof. Dr. Matthew A. Glaser Prof. Dr. Frank Giesselmann |
| Affiliation: | 1. Institute of Physical Chemistry, University of Stuttgart, Stuttgart, Germany;2. Department of Physics, 390 UCB, University of Colorado, Boulder, CO, USA |
| Abstract: | |
| Keywords: | 2D X-ray diffraction patterns Gay– Berne potential liquid crystals MD simulations orientational order parameter |