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F-函数扩展法求解超介质中的亮孤子和暗孤子
引用本文:庄彬先,郭珺,项元江,戴小玉,文双春. F-函数扩展法求解超介质中的亮孤子和暗孤子[J]. 物理学报, 2013, 62(5): 54207-054207. DOI: 10.7498/aps.62.054207
作者姓名:庄彬先  郭珺  项元江  戴小玉  文双春
作者单位:湖南大学信息科学与工程学院, 微纳光电器件及应用教育部重点实验室, 长沙 410082
基金项目:国家自然科学基金 (批准号: 10974049) 资助的课题.
摘    要:利用F-函数扩展法求解超介质中的超短脉冲传输方程, 探讨了超介质中的反常自陡效应和特有的二阶非线性色散效应所导致的新的孤子现象和规律. 结果表明, 正折射区的二阶非线性色散效应可以代替线性色散效应形成亮孤子; 正、负折射区的反常自陡效应由于其符号可改变, 从而可在特定条件下分别在反常色散和正常色散区形成有别于常规介质的亮、暗孤子; 反常自陡效应的符号或者反常自陡效应和三阶线性色散效应的相互比较关系能够控制亮、暗孤子中心的漂移方向.关键词:孤子超介质F-函数扩展法

关 键 词:孤子  超介质  F-函数扩展法
收稿时间:2012-07-09

Bright and dark solitons in metamaterials obtained by extended F-expansion method
Zhuang Bin-Xian,Guo Jun,Xiang Yuan-Jiang,Dai Xiao-Yu,Wen Shuang-Chun. Bright and dark solitons in metamaterials obtained by extended F-expansion method[J]. Acta Physica Sinica, 2013, 62(5): 54207-054207. DOI: 10.7498/aps.62.054207
Authors:Zhuang Bin-Xian  Guo Jun  Xiang Yuan-Jiang  Dai Xiao-Yu  Wen Shuang-Chun
Affiliation:Key Laboratory for Micro-/Nano-Optoelectronic Devices of Ministry of Education, College of Information Science and Engineering, Hunan University, Changsha 410082, China
Abstract:The ultra-short pulse equation in a metamaterial is solved by the extended F-expansion method. The new phenomena and characteristics of solitons, caused by the anomalous self-steepening effect and the second-order nonlinear dispersion in metamaterials, are discussed. The results show that the second-order nonlinear dispersion in the positive-index region may take the place of the linear dispersion to form the bright and dark solitons. Due to the switchable sign of the anomalous self-steepening effect in the positive-index and negative-index regions, the bright and dark solitons separately exist in the anomalous and normal dispersion regions under some specific conditions. The moving directions of the centers of bright and dark solitons can be controlled by the sign of the anomalous self-steepening effect or by the combination of the anomalous self-steepening effect and third-order linear dispersion.
Keywords:soliton  metamaterial  extended F-expansion method
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