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Signal enhancement effect of halogen matrix in electrothermal vaporization-inductively coupled plasma-mass spectrometry
Institution:1. Department of Analytical Chemistry, China Pharmaceutical University, 24 Tongjia Lane, Nanjing 210009, China;2. Key Laboratory of Drug Quality Control and Pharmacovigilance, Ministry of Education, 4 Tongjia Lane, Nanjing 210009, China;3. Department of Antibiotics, Anhui Institute for Food and Drug Control, Hefei 230051, China;4. School of Medical Engineering, Hefei University of Technology, Hefei 230009, China;1. Institute of Quality and Standard of Agro-Products, Zhejiang Academy of Agricultural Sciences, Hangzhou 310021, PR China;2. Food College, Hainan University, Haikou 570228, PR China;3. State Key Laboratory Breeding Base for Zhejiang Sustainable Pest and Disease Control, Hangzhou 310021, PR China;4. Agricultural Ministry Key Laboratory for Pesticide Residue Detection, Hangzhou 310021, PR China;5. Key Laboratory of Detection for Pesticide Residues and Control of Zhejiang, Hangzhou 310021, PR China;1. School of Electrical and Computer Engineering, RMIT University, Melbourne, VIC 3001, Australia;2. Centre for Molecular and Nanoscale Physics, School of Applied Sciences, RMIT University, Melbourne, VIC 3001, Australia;3. School of Chemistry, Physics and Mechanical Engineering, Queensland University of Technology, Brisbane, QLD 4001, Australia
Abstract:In tungsten furnace electrothermal vaporization(ETV)-inductively coupled plasma mass spectrometry(ICP-MS), the presence of halogen matrices caused a signal enhancement for volatile elements such as Zn, Cd and Pb, whose halides melting and boiling points were relatively low. In order to clarify the mechanism of signal enhancement in ETV-ICP-MS, the effects of chemical interaction between analytes and halogen matrices on the surface of ETV furnace, the transport efficiency of vaporized analytes from the furnace into the ICP and the physical properties of the ICP itself and of the micro plasma (interface plasma) in the interface region between the sampling and the skimmer cones were investigated by atomic absorption and atomic emission spectrometry. Among the effects mentioned above, neither the chemical interaction on the surface of the ETV furnace nor the transport efficiency of vaporized analytes could be related to the analyte signal enhancements. The degree of enhancement was found to depend on the ionization potential of the coexisting halogen and was not caused by a variation in the physical properties of the ICP but rather by a variation of those of the interface plasma. These results suggest that the halogen matrices may affect the physical properties of the interface plasma, contributing to the promotion of the ionization of analytes.
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