Determination of stoichiometry of cadmium telluride by XPS |
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| Authors: | Sanjiv Kumar J. V. Ramana V. S. Raju J. Arunachalam S. Gangadharan |
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| Affiliation: | (1) Analytical Chemistry Division, B.A.R.C., 400 085 Bombay, India |
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| Abstract: | Summary The stoichiometry of cadmium telluride has been determined by the non-destructive technique of XPS. The determination has been based on differential photoionisation cross-sections, electron mean free paths and areas due to M5 electrons of Cd and Te. The stoichiometry of Cd and Te determined by XPS has been found to be in good agreement with that obtained by analysing Cd and Te independently by chemical methods. |
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