| XRF基本参数法测量和计算电子材料的组成 |
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| 引用本文： | 眭松山,魏军.XRF基本参数法测量和计算电子材料的组成[J].光谱学与光谱分析,1997,17(3):99-104. |
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| 作者姓名： | 眭松山 魏军 |
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| 作者单位： | 电子科技大学信息材料工程学院 |
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| 摘 要： | 本文主要探讨用ＸＲＦ基本参数法测定电子陶瓷材料的成分含量，计算所需的基本参数都通过数学计算处理，用Ｃ语言设计编面测试软件，该法也适用于定量分析合金材料成分，稳定性和重现性好，高含量时的测试误差小于３％，低含量的误差也较小。
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| 关 键 词： | XRF法 基本参数 电子陶瓷材料 合金 组分 |
DETERMINATION OF COMPOSITION OF ELECTRONIC MATERIAL BY FUNDAMENTAL PARAMETER METHOD OF XRF |
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| S Sui,J Wei,Q Shi.DETERMINATION OF COMPOSITION OF ELECTRONIC MATERIAL BY FUNDAMENTAL PARAMETER METHOD OF XRF[J].Spectroscopy and Spectral Analysis,1997,17(3):99-104. |
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| Authors: | S Sui J Wei Q Shi |
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| Institution: | University of Electronic Science & Technology of China, 610054 Chengdu. |
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| Abstract: | The fundamental parameters (FP) method of XRF in determination of the composition of electronic ceramic materials is studied.The fundamental parameters needed in calculation are developed by math calculation and the program is developed in C language.The method can also be used in determination of the composition of alloy.Some samples are analysed by this method and the relative derivation is less than 3%. |
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| Keywords: | X Ray fluorescence Fundamental parameters Measurement of composition |
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