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用于光刻机模拟运动的精密工件台宏动定位系统研制
引用本文:邓习树,吴运新,杨辅强,王永华.用于光刻机模拟运动的精密工件台宏动定位系统研制[J].电子工业专用设备,2007,36(2):39-43,62.
作者姓名:邓习树  吴运新  杨辅强  王永华
作者单位:中南大学机电工程学院,湖南,长沙,410083;中南大学机电工程学院,湖南,长沙,410083;中南大学机电工程学院,湖南,长沙,410083;中南大学机电工程学院,湖南,长沙,410083
基金项目:国家自然科学基金委项目重大项目课题,国家自然科学基金委与上海市科委联合资助项目
摘    要:为给步进扫描光刻机的设计研究提供理论指导,解决光刻机工件台宏动定位平台的设计和控制问题,根据工业应用中步进扫描光刻机的运动特点和工作要求,设计了一种H型精密工件台宏动定位系统和同步控制方案。试验结果表明,其各项性能指标均满足设计要求,对指导实际工业应用具有一定的参考价值。

关 键 词:光刻机  工件台  定位  研制
文章编号:1004-4507(2007)02-0039-05
修稿时间:2006-01-08

Design and Manufacture on Precision Positioning System of Wafer Stage for a Simulated Macro-motion System of Lithography
DENG Xi-shu,WU Yun-xin,YANG Fu-qiang,WANG Yong-hua.Design and Manufacture on Precision Positioning System of Wafer Stage for a Simulated Macro-motion System of Lithography[J].Equipment for Electronic Products Marufacturing,2007,36(2):39-43,62.
Authors:DENG Xi-shu  WU Yun-xin  YANG Fu-qiang  WANG Yong-hua
Institution:College of Mechanical and Electrical Engineering, Central South University, Changsha 410083, China
Abstract:In order to provide academic steering for the design of Stepping and Scanning Lithography and settle the controlling and designing problems of the Macro-motion table for Lithography wafer Stage, the paper designs an H shape precision macro-positioning system and a synchronous controlling scheme for the wafer stage based on its motion features and working requirements of the stepping and scanning lithography in industry. Testing results indicate that the designed system can meet our design targets and possesses referenced values for industrial application.
Keywords:Lithography  Wafer Stage  Positioning  Design and Manufacture
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