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Reconstruction of Thin Conductivity Imperfections
Authors:Habib Ammari  Elena Beretta ?  Elisa Francini
Institution:1. Centre de Mathématiques Appliquées , CNRS UMS 7641 &2. Ecole Polytechnique , 91128 Palaiseau Cedex, France;3. Dipartimento di Mathematica “G. Castelnuovo” Università di Roma “La Sapineza” , Piazale Aldo Moro 5, 00185 Roma, Italy;4. Istituto per le Applicazioni del Calcolo , CNR , via S. Martha 13A, 50139 Firenze, Italy
Abstract:We consider the case of a uniform plane conductor containing a thin curve-like inhomogeneity of finite conductivity. In this article we prove that the imperfection can be uniquely determined from the boundary measurements of the first order correction term in the asymptotic expansion of the steady state voltage potential as the thickness goes to zero.
Keywords:Thin dielectric inhomogeneities  Uniqueness  Reconstruction
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