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Characterization of a material by probability of linear scattering using effect of target thickness |
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| Authors: | T D Nghiep N T Khai N T Cong D T N Minh |
| Institution: | 1. Institute for Nuclear Science and Technology, 179 Hoang Quoc Viet Road, Hanoi, Vietnam 2. Department of Physics, Vinh University, 182 Nguyen Trai Road, Vinh City, Vietnam 3. Department of Nuclear Energy, Electric Power University, 235 Hoang Quoc Viet Road, Hanoi, Vietnam |
| Abstract: | We report on an experimental test with 662 keV gamma photons scattered from a set of samples from 6C, 13Al, 26Fe, 29Cu, 47Ag, 82Pb and stainless steel for determination of probability of linear scattering, which can be used for characterization of a material. The results show that for the given target and scattering angle, the effect of target thickness in gamma photons scattering relates to single and multiple scattering and that the scattered events exponentially increase with an increase in target thickness and saturation at some values of thickness. The experimental results correlate with the typical function of energy transfer model. |
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