Electrical measurement of sediment layer thickness under suspension flows |
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Authors: | F de Rooij S B Dalziel P F Linden |
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Institution: | (1) Department of Applied Mathematics and Theoretical Physics University of Cambridge, Silver Street Cambridge CB3 9EW, UK, GB |
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Abstract: | This paper reports a new technique to measure the thickness of a layer of deposited sediment as a function of time, independent
of the flow conditions or presence of suspended sediment above the layer. Small electrodes on the bottom and a reference electrode
in the fluid above were used to measure the resistance of the layer with a small AC current and a bridge circuit. Using a multiplexer and an Analog-to-Digital converter the growth of the layer can be accurately
monitored at many locations on the tank bottom. In a trial experiment the sedimentation under a stagnant column of a monodisperse
suspension was examined. The results show that changes in the sediment layer thickness of less than 0.3% can be measured for
layers up to 0.2 g/cm2.
Received: 8 February 1998/Accepted: 19 July 1998 |
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