Soil analysis by thin-film energy-dispersive x-ray fluorescence |
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Authors: | R. Van Grieken,L. Van t Dack,C. Costa Dantas,H. Da Silveira Dantas |
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Affiliation: | Department of Chemistry, University of Antwerp (U.I.A.), B-2610 WilrijkBelgium;Department of Nuclear Energy, Federal University of Pernambuco, Recife, Pe. 50000 Brasil |
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Abstract: | Energy-dispersive x-ray fluorescence is advantageous for trace analysis of soils present as thin films. A target thickness of about 2 mg cm-2 provides a compromise between optimal sensitivity and minimal absorption effect or optimal accuracy. Sample preparation involves only suspending the finely ground soil in water and drying this suspension on a thin mylar foil glued on a ring that fits into the x.r.f. spectrometer. The “effective sample weight” present in the exciting beam area is computed from the scatter peaks, a method that cancels out target heterogeneity problems. High accuracy is demonstrated for many elements in reference soil and rock materials; a precision around 5% and a detection limit around 10 ppm can be achieved. As an illustration, results for 16 trace elements and preliminary interpretation are given for a series of pedologically important soil samples from Brasil. |
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