Electron attachment to propargyl chloride, 305-540 K |
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Authors: | Bopp Joseph C Miller Thomas M Friedman Jeffrey F Shuman Nicholas S Viggiano A A |
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Affiliation: | Space Vehicles Directorate, Air Force Research Laboratory, 29 Randolph Road, Hanscom Air Force Base, Massachusetts 01731-3010, USA. |
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Abstract: | Electron attachment to propargyl chloride (HC≡C-CH(2)Cl) was studied in a flowing-afterglow Langmuir-probe apparatus from 305 to 540 K. The sole ion product in this temperature range is Cl(-). Electron attachment is very inefficient, requiring correction for a competing process of electron recombination with molecular cations produced in reaction between Ar(+) and propargyl chloride and subsequent ion-molecule reactions. The electron attachment rate coefficient was measured to be 1.6×10(-10)cm(3)?s(-1) at 305 K and increased to 1.1×10(-9)cm(3)?s(-1) at 540 K. |
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