Monte Carlo investigation of the effect of small cutouts on beam profile parameters of 12 and 14 MeV electron beams

Cutouts, which are used as field-shaping shield, affect several electron beam parameters. These effects are more observable for small field sizes and high energy electron beams. Owing to the fact that small fields prevent the lateral scatter equilibrium, at higher energies larger field radius is required for the establishment of lateral equilibrium.The profile curves are derived from circular, triangular, and square cutout shapes and size placed in a 10 × 10 cm² electron applicator. These profile curves are obtained using parallel plane type ion chamber at the R₁₀₀, R₉₀, R₈₀ and R₅₀ depths. Correspondingly, the source surface distance is 100 cm.In this study MCNP Monte Carlo (MC) simulation was used to compare Percentage Depth Dose (PDD) and Profile of electron beams.Monte Carlo and measured results showed a good compliance for PDD and beam profile. The measurements and calculations showed that as the field width decreases, the Flatness and Penumbra Ratio also decreases. In other words, flatter plateau was available for larger fields. Also the Coverage Ratio for each of the profiles is presented. The flatness and symmetry values for triangle shapes were greater than the two other shapes.Knowledge of these changes are significant in radiation therapy. Accordingly, a comparison between the Monte Carlo data and the measured results can be beneficial for treatment simulation and development of treatment planning systems.