Optical properties of tin sulphide (SnS) thin film estimated from transmission spectra

Thin films of tin sulphide (SnS) were deposited on tin oxide conducting glass substrates by thermal evaporation technique. The transmission spectrum of the SnS film in the wavelength range from 300 to 1100 nm has been obtained. X-ray diffraction has been used to determine the structure of the films. The film thickness and refractive index have been estimated from the transmission spectra. The results showed that the refractive index of the SnS thin films is thickness independent in the wavelength range 590 ≤ λ ≤ 1100 nm and found to be ~ 1.72. This result indicates that the SnS thin films are homogeneous and isotropic. The energy band gaps were found to be between 1.06 and 1.32 eV, which is in good agreement with literature values. The energy dependence of the obtained refractive index is also investigated.