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Hemisphere m-line spectroscopy and its application to birefringent KTiOPO4 planar waveguides
Authors:Jochen Fick  Bertrand Mnaert  Julien Zaccaro  Paul Moretti
Institution:

aLaboratoire de Spectrométrie Physique, UMR 5588 CNRS – Univesité Joseph Fourier Grenoble I, BP 87, 38402 St. Martin d’Hères, France

bLaboratoire de Cristallographie, UPR 5031 CNRS, BP 166, 38042 Grenoble, France

cLaboratoire de Physico-Chimie des Matériaux Luminescentes, UMR 5620 CNRS – Université Claude Bernard Lyon I, 69622 Villeurbanne, France

Abstract:A modified m-line technique, based on the use of a high index hemisphere instead of a coupling prism is presented. It allows fast characterization of the optical properties as a function of the propagation direction inside a planar waveguide. Results of an ion-implanted KTP waveguide are presented and compared to prism measurements. It is shown that this technique enhances the precision of the waveguide parameters determination and allows to study advanced features such as strong mode hybridization.
Keywords:42  70  Mp  42  82  Et  42  87  −d  48  25  Lc
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